Assignee
OPTRA INC
US·3 granted patents·56 citations·filing 1988–1994
Top patents by PatentIndex Score
3 records- 0177US5098190AMeterology using interferometric measurement technology for measuring scale displacement with three output signalsOPTRA INC·Filed 1989·Granted Mar 24, 1992·30 cites·31 claims
- 0259US4823348ALaser stabilization deviceOPTRA INC·Filed 1988·Granted Apr 18, 1989·13 cites·17 claims
- 0351US5530543ADetector array for use in interferometric metrology systemsOPTRA INC·Filed 1994·Granted Jun 25, 1996·13 cites·20 claims
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