Assignee
OHT INC
JP·29 granted patents·1 pending application·345 citations·filing 1997–2021
Top patents by PatentIndex Score
30 records- 0193US6825673B1Method and apparatus for circuit board continuity test, tool for continuity test, and recording mediumOHT INC·Filed 2000·Granted Nov 30, 2004·64 cites·22 claims
- 0289US7173445B2Sensor for inspection instrument and inspection instrumentOHT INC·Filed 2002·Granted Feb 6, 2007·62 cites·8 claims
- 0377US6710607B2Method and apparatus for inspectionOHT INC·Filed 2001·Granted Mar 23, 2004·22 cites·11 claims
- 0475US6201398B1Non-contact board inspection probeOHT INC·Filed 1997·Granted Mar 13, 2001·48 cites·19 claims
- 0570US6703849B2Inspection apparatus, inspection method and inspection unit thereforOHT INC·Filed 2001·Granted Mar 9, 2004·15 cites·17 claims
- 0669US6614250B1Sensor probe for use in board inspection and manufacturing method thereofOHT INC·Filed 2000·Granted Sep 2, 2003·12 cites·11 claims
- 0767US6859062B2Apparatus and method for inspecting a board used in a liquid crystal panelOHT INC·Filed 2001·Granted Feb 22, 2005·12 cites·12 claims
- 0866US6842026B2Inspecting apparatus and inspecting method for circuit boardOHT INC·Filed 2001·Granted Jan 11, 2005·9 cites·27 claims
- 0965US7138805B2Device and method for inspectionOHT INC·Filed 2001·Granted Nov 21, 2006·10 cites·9 claims
- 1062US6958619B2Inspecting apparatus and inspecting method for circuit boardOHT INC·Filed 2001·Granted Oct 25, 2005·7 cites·33 claims
- 1162US6734692B2Inspection apparatus and sensorOHT INC·Filed 2001·Granted May 11, 2004·11 cites·14 claims
- 1261US6995566B2Circuit pattern inspection apparatus, circuit pattern inspection method, and recording mediumOHT INC·Filed 2002·Granted Feb 7, 2006·10 cites·10 claims
- 1357US11662328B2Capacitive sensor and manufacturing method of capacitive sensorOHT INC·Filed 2021·Granted May 30, 2023·0 cites·3 claims
- 1456US6947853B2Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereonOHT INC·Filed 2004·Granted Sep 20, 2005·7 cites·20 claims
- 1554US6943559B2Circuit pattern inspection device, circuit pattern inspection method, and recording mediumOHT INC·Filed 2002·Granted Sep 13, 2005·6 cites·18 claims
- 1653US6894515B2Inspection unit and method of manufacturing substrateOHT INC·Filed 2001·Granted May 17, 2005·6 cites·11 claims
- 1751US6967498B2Apparatus and method for inspecting electronic circuitsOHT INC·Filed 2003·Granted Nov 22, 2005·4 cites·16 claims
- 1851US6861863B2Inspection apparatus for conductive patterns of a circuit board, and a holder thereofOHT INC·Filed 2001·Granted Mar 1, 2005·6 cites·16 claims
- 1950US6972573B2Device and method for inspecting circuit boardOHT INC·Filed 2001·Granted Dec 6, 2005·5 cites·7 claims
- 2047US7239127B2Apparatus and method for inspecting electronic circuitsOHT INC·Filed 2003·Granted Jul 3, 2007·3 cites·27 claims
- 2144US7088107B2Circuit pattern inspection instrument and pattern inspection methodOHT INC·Filed 2003·Granted Aug 8, 2006·4 cites·9 claims
- 2242US7026870B2Low-noise active RC signal processing circuitOHT INC·Filed 2002·Granted Apr 11, 2006·4 cites·6 claims
- 2342US6160409AInspection method of conductive patternsOHT INC·Filed 1998·Granted Dec 12, 2000·14 cites·18 claims
- 2440US7332914B2Conductor inspection apparatus and conductor inspection methodOHT INC·Filed 2004·Granted Feb 19, 2008·1 cites·8 claims
- 2540US7049826B2Inspection device and inspection methodOHT INC·Filed 2001·Granted May 23, 2006·1 cites·8 claims
- 2636US6992493B2Device and method for substrate displacement detectionOHT INC·Filed 2002·Granted Jan 31, 2006·0 cites·10 claims
- 2735US6952104B2Inspection method and apparatus for testing fine pitch tracesOHT INC·Filed 2003·Granted Oct 4, 2005·0 cites·8 claims
- 2835US6933740B2Electronic circuit inspection sensor and inspection system using sameOHT INC·Filed 2003·Granted Aug 23, 2005·0 cites·9 claims
- 2932US2004243345A1Tester and testing methodOHT INC·Filed 2002·Application pending·0 cites
- 3026US6545484B1Board inspection apparatus and board inspection methodOHT INC·Filed 2000·Granted Apr 8, 2003·2 cites·23 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →