Assignee
OES INC
CA·15 granted patents·56 citations·filing 1997–2018
Top patents by PatentIndex Score
15 records- 0176US10759591B2Dosage monitoring based on signal presenceOES INC·Filed 2018·Granted Sep 1, 2020·2 cites·20 claims
- 0266US7409368B2Dutch auction system with preregistered bid featureOES INC·Filed 2001·Granted Aug 5, 2008·4 cites·9 claims
- 0366US7216519B1Strain monitoring for part quality analysisOES INC·Filed 2004·Granted May 15, 2007·7 cites·18 claims
- 0463US7333906B2Quality analysis including cumulative deviation determinationOES INC·Filed 2005·Granted Feb 19, 2008·5 cites·27 claims
- 0558US9945892B2Wire processing machine including a conductor monitor deviceOES INC·Filed 2015·Granted Apr 17, 2018·1 cites·29 claims
- 0657US9358444B2Display system including DC locally synchronized power line communicationOES INC·Filed 2012·Granted Jun 7, 2016·2 cites·13 claims
- 0752US7765841B2Quality analysis of tube bending processes including mandrel fault detectionOES INC·Filed 2007·Granted Aug 3, 2010·1 cites·20 claims
- 0851US6885463B2Sensor device that provides part quality and profile informationOES INC·Filed 2002·Granted Apr 26, 2005·5 cites·20 claims
- 0950US5841675AMethod and apparatus for monitoring quality of electrical wire connectionsOES INC·Filed 1997·Granted Nov 24, 1998·14 cites·16 claims
- 1049US7603909B2Piezoelectric polymer sensor deviceOES INC·Filed 2007·Granted Oct 20, 2009·0 cites·20 claims
- 1147US9880213B2Conductor monitor device and methodOES INC·Filed 2013·Granted Jan 30, 2018·0 cites·17 claims
- 1247US6496271B1Wire and seal profile analyzerOES INC·Filed 1999·Granted Dec 17, 2002·13 cites·27 claims
- 1343US6798213B2Circuit analyzer with component testing capabilityOES INC·Filed 2002·Granted Sep 28, 2004·2 cites·26 claims
- 1438US9885735B2Sensor device that provides force versus acceleration informationOES INC·Filed 2014·Granted Feb 6, 2018·0 cites·20 claims
- 1526US7719695B2Sensor device with a radiation directing surfaceOES INC·Filed 2006·Granted May 18, 2010·0 cites·11 claims
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