Assignee
NPTEST LLC
US·10 granted patents·285 citations·filing 1999–2003
Top patents by PatentIndex Score
10 records- 0190US6661836B1Measuring jitter of high-speed data channelsNPTEST LLC·Filed 1999·Granted Dec 9, 2003·109 cites·20 claims
- 0284US6748564B1Scan stream sequencing for testing integrated circuitsNPTEST LLC·Filed 2000·Granted Jun 8, 2004·32 cites·8 claims
- 0383US6744267B2Test system and methodologyNPTEST LLC·Filed 2002·Granted Jun 1, 2004·42 cites·48 claims
- 0479US6672947B2Method for global die thinning and polishing of flip-chip packaged integrated circuitsNPTEST LLC·Filed 2001·Granted Jan 6, 2004·31 cites·15 claims
- 0579US6622107B1Edge placement and jitter measurement for electronic elementsNPTEST LLC·Filed 2000·Granted Sep 16, 2003·23 cites·27 claims
- 0674US6775637B2Test method and apparatus for source synchronous signalsNPTEST LLC·Filed 2003·Granted Aug 10, 2004·17 cites·26 claims
- 0766US6630667B1Compact, high collection efficiency scintillator for secondary electron detectionNPTEST LLC·Filed 2000·Granted Oct 7, 2003·10 cites·12 claims
- 0864US6855622B2Method and apparatus for forming a cavity in a semiconductor substrate using a charged particle beamNPTEST LLC·Filed 2002·Granted Feb 15, 2005·10 cites·18 claims
- 0962US6794861B2Method and apparatus for socket calibration of integrated circuit testersNPTEST LLC·Filed 2002·Granted Sep 21, 2004·11 cites·20 claims
- 1035US6737853B2Photoconductive-sampling voltage measurementNPTEST LLC·Filed 2001·Granted May 18, 2004·0 cites·13 claims
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