Assignee
NIKAIDO MASAFUMI
JP·5 granted patents·13 citations·filing 2009–2011
Top patents by PatentIndex Score
5 records- 0172US8589108B2Semiconductor device failure analysis method and apparatus and programNIKAIDO MASAFUMI·Filed 2010·Granted Nov 19, 2013·4 cites·20 claims
- 0268US8478022B2Failure analysis method, apparatus, and program for semiconductor integrated circuitNIKAIDO MASAFUMI·Filed 2010·Granted Jul 2, 2013·3 cites·18 claims
- 0362US8057049B2Display method and display device for displaying a design image and a pickup image in a superimposing manner, and storage medium storing a program for executing the display methodNIKAIDO MASAFUMI·Filed 2009·Granted Nov 15, 2011·4 cites·20 claims
- 0449US8472695B2Method and apparatus for failure analysis of semiconductor integrated circuit devicesNIKAIDO MASAFUMI·Filed 2009·Granted Jun 25, 2013·2 cites·18 claims
- 0535US8774492B2Method, apparatus and program for processing a contrast picture image of a semiconductor elementNIKAIDO MASAFUMI·Filed 2011·Granted Jul 8, 2014·0 cites·17 claims
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