Assignee
NEXTEST SYSTEMS CORP
US·8 granted patents·1 pending application·142 citations·filing 2001–2007
Top patents by PatentIndex Score
9 records- 0188US7385385B2System for testing DUT and tester for use therewithNEXTEST SYSTEMS CORP·Filed 2002·Granted Jun 10, 2008·69 cites·40 claims
- 0279US6754868B2Semiconductor test system having double data rate pin scramblingNEXTEST SYSTEMS CORP·Filed 2001·Granted Jun 22, 2004·27 cites·23 claims
- 0375US7765080B2System for testing smart cards and method for sameNEXTEST SYSTEMS CORP·Filed 2006·Granted Jul 27, 2010·11 cites·17 claims
- 0469US7003697B2Apparatus having pattern scrambler for testing a semiconductor device and method for operating sameNEXTEST SYSTEMS CORP·Filed 2002·Granted Feb 21, 2006·16 cites·23 claims
- 0563US7312604B2Portable manipulator for stackable semiconductor test systemNEXTEST SYSTEMS CORP·Filed 2005·Granted Dec 25, 2007·4 cites·5 claims
- 0658US7098650B2Apparatus for planarizing a probe card and method using sameNEXTEST SYSTEMS CORP·Filed 2004·Granted Aug 29, 2006·8 cites·20 claims
- 0752US7472326B2Semiconductor test system having multitasking algorithmic pattern generatorNEXTEST SYSTEMS CORP·Filed 2003·Granted Dec 30, 2008·4 cites·17 claims
- 0849US7861059B2Method for testing and programming memory devices and system for sameNEXTEST SYSTEMS CORP·Filed 2005·Granted Dec 28, 2010·3 cites·18 claims
- 0942US2008100322A1Portable manipulator for stackable semiconductor test systemNEXTEST SYSTEMS CORP·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →