Assignee
NEUF INC
KR·3 granted patents·5 citations·filing 2022–2023
Top patents by PatentIndex Score
3 records- 0187US11585768B1System and method for inspecting defects of structure by using x-rayNEUF INC·Filed 2022·Granted Feb 21, 2023·5 cites·4 claims
- 0270US12181426B2System and method for inspecting defects of structure by using X-rayNEUF INC·Filed 2023·Granted Dec 31, 2024·0 cites·11 claims
- 0365US11821854B2System and method for inspecting defects of structure by using X-rayNEUF INC·Filed 2023·Granted Nov 21, 2023·0 cites·14 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →