Assignee
NEOCERA INC
US·19 granted patents·1 pending application·659 citations·filing 1994–2005
Top patents by PatentIndex Score
20 records- 0194US7122949B2Cylindrical electron beam generating/triggering device and method for generation of electronsNEOCERA INC·Filed 2004·Granted Oct 17, 2006·235 cites·29 claims
- 0287US6597185B1Apparatus for localized measurements of complex permittivity of a materialNEOCERA INC·Filed 2000·Granted Jul 22, 2003·62 cites·19 claims
- 0386US5635453ASuperconducting thin film system using a garnet substrateNEOCERA INC·Filed 1994·Granted Jun 3, 1997·54 cites·9 claims
- 0483US6491759B1Combinatorial synthesis systemNEOCERA INC·Filed 2000·Granted Dec 10, 2002·53 cites·15 claims
- 0582US6090207ATranslational target assembly for thin film deposition systemNEOCERA INC·Filed 1998·Granted Jul 18, 2000·61 cites·26 claims
- 0679US6680617B2Apertured probes for localized measurements of a material's complex permittivity and fabrication methodNEOCERA INC·Filed 2002·Granted Jan 20, 2004·27 cites·19 claims
- 0778US7102363B2Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuitsNEOCERA INC·Filed 2005·Granted Sep 5, 2006·7 cites·20 claims
- 0877US5420102ASuperconducting films on alkaline earth fluoride substrate with multiple buffer layersNEOCERA INC·Filed 1994·Granted May 30, 1995·40 cites·12 claims
- 0975US6856140B2System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probesNEOCERA INC·Filed 2003·Granted Feb 15, 2005·25 cites·21 claims
- 1068US6959481B2Apertured probes for localized measurements of a material's complex permittivity and fabrication methodNEOCERA INC·Filed 2003·Granted Nov 1, 2005·12 cites·9 claims
- 1159US5993544ANon-linear optical thin film layer systemNEOCERA INC·Filed 1998·Granted Nov 30, 1999·29 cites·15 claims
- 1254US6632282B2Planetary multi-substrate holder system for material depositionNEOCERA INC·Filed 2001·Granted Oct 14, 2003·3 cites·8 claims
- 1350US6943562B2Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuitsNEOCERA INC·Filed 2003·Granted Sep 13, 2005·5 cites·20 claims
- 1449US6074990ASuperconducting garnet thin film systemNEOCERA INC·Filed 1997·Granted Jun 13, 2000·15 cites·22 claims
- 1545US5472510ASuperconducting films on alkaline earth fluoride substrates with multiple buffer layersNEOCERA INC·Filed 1994·Granted Dec 5, 1995·9 cites·1 claims
- 1644US2004079281A1Scanned focus deposition systemNEOCERA INC·Filed 2003·Application pending·0 cites
- 1742US5654975AScanning laser beam delivery systemNEOCERA INC·Filed 1996·Granted Aug 5, 1997·13 cites·20 claims
- 1841US7019521B2Fault isolation of circuit defects using comparative magnetic field imagingNEOCERA INC·Filed 2004·Granted Mar 28, 2006·4 cites·20 claims
- 1935US5458686APulsed laser passive filter deposition systemNEOCERA INC·Filed 1995·Granted Oct 17, 1995·5 cites·20 claims
- 2027US6497193B2Scanned focus deposition systemNEOCERA INC·Filed 1999·Granted Dec 24, 2002·0 cites·7 claims
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