Assignee
NARAZAKI ATSUSHI
JP·8 granted patents·13 citations·filing 2009–2011
Top patents by PatentIndex Score
8 records- 0179US8552468B2Power semiconductor deviceNARAZAKI ATSUSHI·Filed 2010·Granted Oct 8, 2013·6 cites·3 claims
- 0272US8124533B2Method of manufacturing power semiconductor deviceNARAZAKI ATSUSHI·Filed 2009·Granted Feb 28, 2012·5 cites·9 claims
- 0359US8178365B2Method of manufacturing semiconductor deviceNARAZAKI ATSUSHI·Filed 2011·Granted May 15, 2012·1 cites·6 claims
- 0451US8530966B2Semiconductor deviceNARAZAKI ATSUSHI·Filed 2011·Granted Sep 10, 2013·1 cites·4 claims
- 0542US8884383B2Semiconductor device and method of testing the sameNARAZAKI ATSUSHI·Filed 2011·Granted Nov 11, 2014·0 cites·9 claims
- 0640US8618604B2Semiconductor device and method of manufacturing the sameNARAZAKI ATSUSHI·Filed 2010·Granted Dec 31, 2013·0 cites·14 claims
- 0740US8593167B2Semiconductor device test method and apparatus, and semiconductor deviceNARAZAKI ATSUSHI·Filed 2011·Granted Nov 26, 2013·0 cites·4 claims
- 0840US8519733B2Method of measuring characteristics of a semiconductor element and method of manufacturing a semiconductor deviceNARAZAKI ATSUSHI·Filed 2011·Granted Aug 27, 2013·0 cites·8 claims
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