Assignee
NANOWAVE INC
US·2 granted patents·147 citations·filing 2000–2001
Top patents by PatentIndex Score
2 records- 0196US6639686B1Method of and apparatus for real-time continual nanometer scale position measurement by beam probing as by laser beams and the like of atomic and other undulating surfaces such as gratings or the like relatively moving with respect to the probing beamsNANOWAVE INC·Filed 2000·Granted Oct 28, 2003·143 cites·28 claims
- 0248US6774416B2Small area cascode FET structure operating at mm-wave frequenciesNANOWAVE INC·Filed 2001·Granted Aug 10, 2004·4 cites·45 claims
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