Assignee
NANODEVICES INC
US·4 granted patents·336 citations·filing 1998–2000
Top patents by PatentIndex Score
4 records- 0194US6279389B1AFM with referenced or differential height measurementNANODEVICES INC·Filed 2000·Granted Aug 28, 2001·57 cites·5 claims
- 0290US6196061B1AFM with referenced or differential height measurementNANODEVICES INC·Filed 1998·Granted Mar 6, 2001·108 cites·32 claims
- 0390US6189374B1Active probe for an atomic force microscope and method of use thereofNANODEVICES INC·Filed 1999·Granted Feb 20, 2001·96 cites·43 claims
- 0488US6530266B1Active probe for an atomic force microscope and method of use thereofNANODEVICES INC·Filed 1999·Granted Mar 11, 2003·75 cites·49 claims
Join the waitlist — get patent alerts
Get an alert when NANODEVICES INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →