Assignee
NAKASHO EIJI
JP·2 granted patents·7 citations·filing 2011–2012
Top patents by PatentIndex Score
2 records- 0174US8619252B2Microscope including a light intensity measuring unit for measuring an intensity of light emitted from the microscopeNAKASHO EIJI·Filed 2011·Granted Dec 31, 2013·6 cites·16 claims
- 0256US9007453B2Time lapse observation method, and time lapse observation apparatus and multiphoton microscope used thereforNAKASHO EIJI·Filed 2012·Granted Apr 14, 2015·1 cites·19 claims
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