Assignee
MOROZ VICTOR
US·20 granted patents·2 pending applications·99 citations·filing 2005–2013
Top patents by PatentIndex Score
22 records- 0197US8723268B2N-channel and P-channel end-to-end finFET cell architecture with relaxed gate pitchMOROZ VICTOR·Filed 2012·Granted May 13, 2014·26 cites·33 claims
- 0293US8609550B2Methods for manufacturing integrated circuit devices having features with reduced edge curvatureMOROZ VICTOR·Filed 2012·Granted Dec 17, 2013·11 cites·22 claims
- 0392US8901615B2N-channel and P-channel end-to-end finfet cell architectureMOROZ VICTOR·Filed 2012·Granted Dec 2, 2014·16 cites·13 claims
- 0488US8407634B1Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2005·Granted Mar 26, 2013·10 cites·26 claims
- 0586US9064808B2Integrated circuit devices having features with reduced edge curvature and methods for manufacturing the sameMOROZ VICTOR·Filed 2011·Granted Jun 23, 2015·6 cites·26 claims
- 0682US8701054B2Boosting transistor performance with non-rectangular channelsMOROZ VICTOR·Filed 2011·Granted Apr 15, 2014·5 cites·40 claims
- 0781US8069430B2Stress-managed revision of integrated circuit layoutsMOROZ VICTOR·Filed 2009·Granted Nov 29, 2011·8 cites·7 claims
- 0879US8686512B2Elevation of transistor channels to reduce impact of shallow trench isolation on transistor performanceMOROZ VICTOR·Filed 2011·Granted Apr 1, 2014·4 cites·7 claims
- 0979US8661398B1Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2013·Granted Feb 25, 2014·2 cites·21 claims
- 1079US8615728B2Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2009·Granted Dec 24, 2013·4 cites·24 claims
- 1173US8219961B2Method for compensation of process-induced performance variation in a MOSFET integrated circuitMOROZ VICTOR·Filed 2011·Granted Jul 10, 2012·3 cites·26 claims
- 1270US9287253B2Method and apparatus for floating or applying voltage to a well of an integrated circuitMOROZ VICTOR·Filed 2011·Granted Mar 15, 2016·2 cites·20 claims
- 1367US8713510B2Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2009·Granted Apr 29, 2014·1 cites·12 claims
- 1464US9917018B2Method and apparatus with channel stop doped devicesMOROZ VICTOR·Filed 2012·Granted Mar 13, 2018·1 cites·27 claims
- 1561US8881073B1Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2013·Granted Nov 4, 2014·0 cites·12 claims
- 1659US8762924B2Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2009·Granted Jun 24, 2014·0 cites·16 claims
- 1759US8560995B2Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2009·Granted Oct 15, 2013·0 cites·35 claims
- 1859US8413096B2Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2009·Granted Apr 2, 2013·0 cites·13 claims
- 1955US9472423B2Method for suppressing lattice defects in a semiconductor substrateMOROZ VICTOR·Filed 2007·Granted Oct 18, 2016·0 cites·8 claims
- 2054US9190346B2Latch-up suppression and substrate noise coupling reduction through a substrate back-tie for 3D integrated circuitsMOROZ VICTOR·Filed 2012·Granted Nov 17, 2015·0 cites·17 claims
- 2154US2013125075A1Method for rapid estimation of layout-dependent threshold voltage variation in a mosfet arrayMOROZ VICTOR·Filed 2012·Application pending·0 cites
- 2248US2012280354A1Methods for fabricating high-density integrated circuit devicesMOROZ VICTOR·Filed 2011·Application pending·0 cites
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