Assignee
MICRON TECHNOLGOY INC
US·2 granted patents·278 citations·filing 1997–2003
Top patents by PatentIndex Score
2 records- 0198US6018249ATest system with mechanical alignment for semiconductor chip scale packages and diceMICRON TECHNOLGOY INC·Filed 1997·Granted Jan 25, 2000·268 cites·18 claims
- 0270US7115532B2Methods of forming patterned photoresist layers over semiconductor substratesMICRON TECHNOLGOY INC·Filed 2003·Granted Oct 3, 2006·10 cites·75 claims
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