Assignee
MICRO EPSILON MESSTECHNIK
DE·35 granted patents·2 pending applications·1,050 citations·filing 1986–2008
Top patents by PatentIndex Score
37 records- 0197US5485082AMethod of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the likeMICRO EPSILON MESSTECHNIK·Filed 1990·Granted Jan 16, 1996·195 cites·12 claims
- 0293US7561273B2Device and method for measurement of surfacesMICRO EPSILON MESSTECHNIK·Filed 2007·Granted Jul 14, 2009·122 cites·18 claims
- 0392US6479990B2Eddy current sensor for analyzing a test object and method of operating sameMICRO EPSILON MESSTECHNIK·Filed 2001·Granted Nov 12, 2002·98 cites·32 claims
- 0490US7061230B2Circuit and method for measuring distancesMICRO EPSILON MESSTECHNIK·Filed 2004·Granted Jun 13, 2006·54 cites·26 claims
- 0589US7369225B2Device and method for inspecting surfaces in the interior of holesMICRO EPSILON MESSTECHNIK·Filed 2006·Granted May 6, 2008·23 cites·19 claims
- 0687US6462536B1Eddy current sensorMICRO EPSILON MESSTECHNIK·Filed 1998·Granted Oct 8, 2002·66 cites·21 claims
- 0786US5302894ANoncontacting displacement measuring system having an electric field shieldMICRO EPSILON MESSTECHNIK·Filed 1990·Granted Apr 12, 1994·60 cites·13 claims
- 0883US7602175B2Non-contacting position measuring systemMICRO EPSILON MESSTECHNIK·Filed 2006·Granted Oct 13, 2009·14 cites·21 claims
- 0983US6246230B1Non-contact position sensorMICRO EPSILON MESSTECHNIK·Filed 1997·Granted Jun 12, 2001·50 cites·34 claims
- 1082US5629619ANoncontact distance-measuring system having at least one coil and method of noncontact distance measuring operating either on the basis of eddy currents or by inductanceMICRO EPSILON MESSTECHNIK·Filed 1993·Granted May 13, 1997·42 cites·18 claims
- 1182US5525903AEddy current method of acquiring the surface layer properties of a metallic targetMICRO EPSILON MESSTECHNIK·Filed 1994·Granted Jun 11, 1996·63 cites·13 claims
- 1282US5477473ASensor-drive and signal-processing methodMICRO EPSILON MESSTECHNIK·Filed 1993·Granted Dec 19, 1995·43 cites·18 claims
- 1376US7345471B2Device and method for detecting the position and the velocity of a test objectMICRO EPSILON MESSTECHNIK·Filed 2007·Granted Mar 18, 2008·10 cites·37 claims
- 1476US7265542B2Process and device for contactless measurement of rotational speedMICRO EPSILON MESSTECHNIK·Filed 2006·Granted Sep 4, 2007·7 cites·15 claims
- 1574US7576849B2Method and apparatus for optically controlling the quality of objects having a circular edgeMICRO EPSILON MESSTECHNIK·Filed 2005·Granted Aug 18, 2009·4 cites·28 claims
- 1672US5559431AMethod of calibrating a sensorMICRO EPSILON MESSTECHNIK·Filed 1994·Granted Sep 24, 1996·39 cites·18 claims
- 1769US4847794AError compensation method for transducers having non-linear characteristics, and an assembly for carrying out said methodMICRO EPSILON MESSTECHNIK·Filed 1986·Granted Jul 11, 1989·21 cites·10 claims
- 1868US6571133B1Method for process monitoring, control, and adjustmentMICRO EPSILON MESSTECHNIK·Filed 1998·Granted May 27, 2003·48 cites·15 claims
- 1968US5898304ASensor arrangement including a neural network and detection method using sameMICRO EPSILON MESSTECHNIK·Filed 1995·Granted Apr 27, 1999·25 cites·18 claims
- 2060US6762922B2Device and method for detecting the position of an objectMICRO EPSILON MESSTECHNIK·Filed 2002·Granted Jul 13, 2004·10 cites·35 claims
- 2157US7545154B2Sensor using the capacitive measuring principleMICRO EPSILON MESSTECHNIK·Filed 2007·Granted Jun 9, 2009·1 cites·19 claims
- 2252US7257994B2Measuring device and method for determining the position of an electrically conductive test objectMICRO EPSILON MESSTECHNIK·Filed 2005·Granted Aug 21, 2007·1 cites·13 claims
- 2350US7533472B2Cable length sensorMICRO EPSILON MESSTECHNIK·Filed 2008·Granted May 19, 2009·5 cites·26 claims
- 2450US6867585B2Circuit and method for compensating for temperatureMICRO EPSILON MESSTECHNIK·Filed 2003·Granted Mar 15, 2005·4 cites·28 claims
- 2549US7808314B2Circuit for adjusting an impedanceMICRO EPSILON MESSTECHNIK·Filed 2007·Granted Oct 5, 2010·1 cites·19 claims
- 2649US7592804B2Contactless eddy current sensor and process for detecting test objectsMICRO EPSILON MESSTECHNIK·Filed 2007·Granted Sep 22, 2009·1 cites·16 claims
- 2746US7092833B2Method and circuit for linearizing nonlinear curvesMICRO EPSILON MESSTECHNIK·Filed 2003·Granted Aug 15, 2006·4 cites·39 claims
- 2845US6999892B2Circuit arrangement and method for controlling and evaluating signal detectorsMICRO EPSILON MESSTECHNIK·Filed 2002·Granted Feb 14, 2006·2 cites·27 claims
- 2944US2007105238A1Method for processing values from a measurementMICRO EPSILON MESSTECHNIK·Filed 2007·Application pending·0 cites
- 3042US7012462B2Demodulation circuitMICRO EPSILON MESSTECHNIK·Filed 2003·Granted Mar 14, 2006·2 cites·22 claims
- 3141US7150016B2Systems, methods and computer program products for controlling and visualizing processesMICRO EPSILON MESSTECHNIK·Filed 2001·Granted Dec 12, 2006·3 cites·7 claims
- 3240US7157902B2Displacement sensor with inner and outer winding sectionsMICRO EPSILON MESSTECHNIK·Filed 2004·Granted Jan 2, 2007·0 cites·21 claims
- 3340US2008039867A1Actuator Platform For Guiding End Effectors In Minimally Invasive InterventionsMICRO EPSILON MESSTECHNIK·Filed 2004·Application pending·0 cites
- 3439US6822442B2Sensor arrangement for detecting properties of a targetMICRO EPSILON MESSTECHNIK·Filed 2003·Granted Nov 23, 2004·1 cites·20 claims
- 3535US6318153B1Non-contact film thickness gauging sensorMICRO EPSILON MESSTECHNIK·Filed 1996·Granted Nov 20, 2001·31 cites·13 claims
- 3628US5291794AMethod and apparatus for monitoring mechanical power transmission systemsMICRO EPSILON MESSTECHNIK·Filed 1992·Granted Mar 8, 1994·0 cites·27 claims
- 3727US7275015B2Method and device for determining motion parameters of a conductive, profiled surfaceMICRO EPSILON MESSTECHNIK·Filed 2005·Granted Sep 25, 2007·0 cites·28 claims
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