Assignee
METRONICS INC
US·7 granted patents·154 citations·filing 1995–2001
Technology mixG01B3
Top patents by PatentIndex Score
7 records- 0184US5590060AApparatus and method for an object measurement systemMETRONICS INC·Filed 1995·Granted Dec 31, 1996·105 cites·30 claims
- 0267US6704102B2Calibration artifact and method of using the sameMETRONICS INC·Filed 2001·Granted Mar 9, 2004·16 cites·4 claims
- 0351US5781450AObject inspection system and methodMETRONICS INC·Filed 1996·Granted Jul 14, 1998·20 cites·58 claims
- 0439USD459248SDigital readoutMETRONICS INC·Filed 2001·Granted Jun 25, 2002·4 cites·1 claims
- 0539USD457444SDigital readoutMETRONICS INC·Filed 2001·Granted May 21, 2002·4 cites·1 claims
- 0635USD457080SDigital readoutMETRONICS INC·Filed 2001·Granted May 14, 2002·3 cites·1 claims
- 0732USD458549SDigital readoutMETRONICS INC·Filed 2001·Granted Jun 11, 2002·2 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when METRONICS INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →