Assignee
MASUDA TAKASHI
JP·3 granted patents·1 pending application·5 citations·filing 2007–2010
Top patents by PatentIndex Score
4 records- 0176US8105870B2Method for manufacturing semiconductor device, semiconductor device, semiconductor circuit, electro-optical device, and electronic apparatusMASUDA TAKASHI·Filed 2008·Granted Jan 31, 2012·5 cites·5 claims
- 0247US8404574B2Method for manufacturing silicon carbide semiconductor deviceMASUDA TAKASHI·Filed 2009·Granted Mar 26, 2013·0 cites·4 claims
- 0341US2012234231A1Process for producing silicon carbide single crystalsMASUDA TAKASHI·Filed 2010·Application pending·0 cites
- 0433US8077300B2MTF measuring system, MTF measuring method, MTF measuring unit and MTF measuring programMASUDA TAKASHI·Filed 2007·Granted Dec 13, 2011·0 cites·1 claims
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