Assignee
LOGICVISION INC
US·51 granted patents·3 pending applications·2,354 citations·filing 1996–2009
Top patents by PatentIndex Score
54 records- 0199US6829730B2Method of designing circuit having multiple test access ports, circuit produced thereby and method of using sameLOGICVISION INC·Filed 2001·Granted Dec 7, 2004·192 cites·51 claims
- 0296US6671839B1Scan test method for providing real time identification of failing test patterns and test bist controller for use therewithLOGICVISION INC·Filed 2002·Granted Dec 30, 2003·96 cites·70 claims
- 0395US6586921B1Method and circuit for testing DC parameters of circuit input and output nodesLOGICVISION INC·Filed 2000·Granted Jul 1, 2003·93 cites·47 claims
- 0494US6510534B1Method and apparatus for testing high performance circuitsLOGICVISION INC·Filed 2000·Granted Jan 21, 2003·82 cites·44 claims
- 0594US6492798B2Method and circuit for testing high frequency mixed signal circuits with low frequency signalsLOGICVISION INC·Filed 2001·Granted Dec 10, 2002·58 cites·33 claims
- 0694US6327684B1Method of testing at-speed circuits having asynchronous clocks and controller for use therewithLOGICVISION INC·Filed 1999·Granted Dec 4, 2001·119 cites·31 claims
- 0793US6442722B1Method and apparatus for testing circuits with multiple clocksLOGICVISION INC·Filed 1999·Granted Aug 27, 2002·220 cites·34 claims
- 0892US6760874B2Test access circuit and method of accessing embedded test controllers in integrated circuit modulesLOGICVISION INC·Filed 2002·Granted Jul 6, 2004·54 cites·53 claims
- 0992US6745359B2Method of masking corrupt bits during signature analysis and circuit for use therewithLOGICVISION INC·Filed 2002·Granted Jun 1, 2004·49 cites·55 claims
- 1091US7370251B2Method and circuit for collecting memory failure informationLOGICVISION INC·Filed 2003·Granted May 6, 2008·55 cites·54 claims
- 1190US7617425B2Method for at-speed testing of memory interface using scanLOGICVISION INC·Filed 2006·Granted Nov 10, 2009·20 cites·27 claims
- 1288US6691269B2Method for scan controlled sequential sampling of analog signals and circuit for use therewithLOGICVISION INC·Filed 2001·Granted Feb 10, 2004·40 cites·21 claims
- 1388US6363520B1Method for testability analysis and test point insertion at the RT-level of a hardware development language (HDL) specificationLOGICVISION INC·Filed 1998·Granted Mar 26, 2002·85 cites·36 claims
- 1488US6115827AClock skew management method and apparatusLOGICVISION INC·Filed 1998·Granted Sep 5, 2000·72 cites·43 claims
- 1588US5659312AMethod and apparatus for testing digital to analog and analog to digital convertersLOGICVISION INC·Filed 1996·Granted Aug 19, 1997·106 cites·23 claims
- 1687US6885213B2Circuit and method for accurately applying a voltage to a node of an integrated circuitLOGICVISION INC·Filed 2003·Granted Apr 26, 2005·33 cites·10 claims
- 1787US6396889B1Method and circuit for built in self test of phase locked loopsLOGICVISION INC·Filed 1998·Granted May 28, 2002·70 cites·41 claims
- 1886US7155651B2Clock controller for at-speed testing of scan circuitsLOGICVISION INC·Filed 2004·Granted Dec 26, 2006·31 cites·29 claims
- 1986US6615392B1Hierarchical design and test method and system, program product embodying the method and integrated circuit produced therebyLOGICVISION INC·Filed 2000·Granted Sep 2, 2003·44 cites·75 claims
- 2085US6763489B2Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit descriptionLOGICVISION INC·Filed 2001·Granted Jul 13, 2004·31 cites·65 claims
- 2184US6834361B2Method of testing embedded memory array and embedded memory controller for use therewithLOGICVISION INC·Filed 2001·Granted Dec 21, 2004·43 cites·28 claims
- 2284US6678875B2Self-contained embedded test design environment and environment setup utilityLOGICVISION INC·Filed 2002·Granted Jan 13, 2004·40 cites·41 claims
- 2384US6211803B1Test circuit and method for measuring switching point voltages and integral non-linearity (INL) of analog to digital convertersLOGICVISION INC·Filed 1998·Granted Apr 3, 2001·55 cites·30 claims
- 2483US7159159B2Circuit and method for adding parametric test capability to digital boundary scanLOGICVISION INC·Filed 2003·Granted Jan 2, 2007·27 cites·19 claims
- 2583US6961871B2Method, system and program product for testing and/or diagnosing circuits using embedded test controller access dataLOGICVISION INC·Filed 2001·Granted Nov 1, 2005·45 cites·90 claims
- 2681US7158899B2Circuit and method for measuring jitter of high speed signalsLOGICVISION INC·Filed 2004·Granted Jan 2, 2007·34 cites·47 claims
- 2781US6330681B1Method and apparatus for controlling power level during BISTLOGICVISION INC·Filed 1998·Granted Dec 11, 2001·46 cites·23 claims
- 2880US6204694B1Programmable clock signal generation circuits and methods for generating accurate, high frequency, clock signalsLOGICVISION INC·Filed 1999·Granted Mar 20, 2001·96 cites·28 claims
- 2979US6717415B2Circuit and method for determining the location of defect in a circuitLOGICVISION INC·Filed 2002·Granted Apr 6, 2004·23 cites·5 claims
- 3077US6145105AMethod and apparatus for scan testing digital circuitsLOGICVISION INC·Filed 1998·Granted Nov 7, 2000·42 cites·28 claims
- 3176US6895535B2Circuit and method for testing high speed data circuitsLOGICVISION INC·Filed 2003·Granted May 17, 2005·19 cites·15 claims
- 3276US5900753AAsynchronous interfaceLOGICVISION INC·Filed 1997·Granted May 4, 1999·76 cites·67 claims
- 3375US7194669B2Method and circuit for at-speed testing of scan circuitsLOGICVISION INC·Filed 2003·Granted Mar 20, 2007·17 cites·45 claims
- 3475US6567971B1Circuit synthesis method using technology parameters extracting circuitLOGICVISION INC·Filed 2001·Granted May 20, 2003·26 cites·28 claims
- 3574US6725435B2Method and program product for completing a circuit design having embedded test structuresLOGICVISION INC·Filed 2002·Granted Apr 20, 2004·21 cites·23 claims
- 3674US6590412B2Circuit and method for detecting transient voltages on a dc power supply railLOGICVISION INC·Filed 2001·Granted Jul 8, 2003·17 cites·37 claims
- 3773US7453255B2Circuit and method for measuring delay of high speed signalsLOGICVISION INC·Filed 2004·Granted Nov 18, 2008·17 cites·33 claims
- 3872US6868532B2Method and program product for designing hierarchical circuit for quiescent current testing and circuit produced therebyLOGICVISION INC·Filed 2001·Granted Mar 15, 2005·15 cites·78 claims
- 3971US6614263B2Method and circuitry for controlling clocks of embedded blocks during logic bist test modeLOGICVISION INC·Filed 2002·Granted Sep 2, 2003·14 cites·54 claims
- 4070US7219282B2Boundary scan with strobed pad driver enableLOGICVISION INC·Filed 2003·Granted May 15, 2007·14 cites·7 claims
- 4170US6738938B2Method for collecting failure information for a memory using an embedded test controllerLOGICVISION INC·Filed 2002·Granted May 18, 2004·17 cites·52 claims
- 4270US6703820B2Method and circuit for testing high frequency mixed signal circuits with low frequency signalsLOGICVISION INC·Filed 2002·Granted Mar 9, 2004·12 cites·6 claims
- 4369US7139946B2Method and test circuit for testing memory internal write enableLOGICVISION INC·Filed 2003·Granted Nov 21, 2006·16 cites·49 claims
- 4464US6487688B1Method for testing circuits with tri-state drivers and circuit for use therewithLOGICVISION INC·Filed 1999·Granted Nov 26, 2002·25 cites·30 claims
- 4561US7188274B2Memory repair analysis method and circuitLOGICVISION INC·Filed 2004·Granted Mar 6, 2007·12 cites·46 claims
- 4660US6862717B2Method and program product for designing hierarchical circuit for quiescent current testingLOGICVISION INC·Filed 2001·Granted Mar 1, 2005·9 cites·79 claims
- 4759US7424656B2Clocking methodology for at-speed testing of scan circuits with synchronous clocksLOGICVISION INC·Filed 2005·Granted Sep 9, 2008·3 cites·21 claims
- 4858US7191374B2Method of and program product for performing gate-level diagnosis of failing vectorsLOGICVISION INC·Filed 2003·Granted Mar 13, 2007·9 cites·35 claims
- 4955US7103860B2Verification of embedded test structures in circuit designsLOGICVISION INC·Filed 2003·Granted Sep 5, 2006·7 cites·55 claims
- 5048US7257733B2Memory repair circuit and methodLOGICVISION INC·Filed 2004·Granted Aug 14, 2007·5 cites·18 claims
Showing the top 50 of 54 patent records by PatentIndex Score.
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