Assignee
LAYTEC AG
DE·0 granted patents·4 pending applications·0 citations·filing 2013–2023
Top patents by PatentIndex Score
4 records- 0142US2024027184A1Method and Apparatus for Measuring the Thickness of a Transparent Layer on Nanometer ScaleLAYTEC AG·Filed 2023·Application pending·0 cites
- 0235US2021381899A1Method and device for the in-situ determination of the temperature of a sampleLAYTEC AG·Filed 2021·Application pending·0 cites
- 0330US2014038315A1Apparatus and method for measuring the dimensions of 1-dimensional and 0-dimensional nanostructures in real-time during epitaxial growthLAYTEC AG·Filed 2013·Application pending·0 cites
- 0427US2013294476A1Flat light emitting plate for simulating thermal radiation, method for calibrating a pyrometer and method for determining the temperature of a semiconducting waferLAYTEC AG·Filed 2013·Application pending·0 cites
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