Assignee
KRATOS ANALYTICAL LTD
GB·24 granted patents·2 pending applications·289 citations·filing 1985–2022
Top patents by PatentIndex Score
26 records- 0186US6888129B2Ion optics system for TOF mass spectrometerKRATOS ANALYTICAL LTD·Filed 2001·Granted May 3, 2005·25 cites·22 claims
- 0283US6717134B2Calibration methodKRATOS ANALYTICAL LTD·Filed 2001·Granted Apr 6, 2004·21 cites·25 claims
- 0380US5164594ACharged particle extraction arrangementKRATOS ANALYTICAL LTD·Filed 1991·Granted Nov 17, 1992·44 cites·18 claims
- 0477US7071463B2Calibration methodKRATOS ANALYTICAL LTD·Filed 2003·Granted Jul 4, 2006·13 cites·11 claims
- 0574US5180914AMass spectrometry systemsKRATOS ANALYTICAL LTD·Filed 1991·Granted Jan 19, 1993·28 cites·22 claims
- 0670US7910878B2Method and apparatus for ion axial spatial distribution focusingKRATOS ANALYTICAL LTD·Filed 2009·Granted Mar 22, 2011·2 cites·32 claims
- 0769US5164593AMass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangementKRATOS ANALYTICAL LTD·Filed 1991·Granted Nov 17, 1992·27 cites·10 claims
- 0867US7470901B2Charged particle spectrometer and detector thereforKRATOS ANALYTICAL LTD·Filed 2003·Granted Dec 30, 2008·10 cites·15 claims
- 0967US5077472AIon mirror for a time-of-flight mass spectrometerKRATOS ANALYTICAL LTD·Filed 1990·Granted Dec 31, 1991·18 cites·20 claims
- 1067US4908512AApparatus and methods of use in the mass analysis of chemical samplesKRATOS ANALYTICAL LTD·Filed 1985·Granted Mar 13, 1990·14 cites·6 claims
- 1164US5196708AParticle sourceKRATOS ANALYTICAL LTD·Filed 1992·Granted Mar 23, 1993·20 cites·9 claims
- 1262US5321262AElectron imaging band pass analyser for a photoelectron spectromicroscopeKRATOS ANALYTICAL LTD·Filed 1992·Granted Jun 14, 1994·13 cites·9 claims
- 1360US7579586B2Ion selectorKRATOS ANALYTICAL LTD·Filed 2005·Granted Aug 25, 2009·1 cites·34 claims
- 1458US5185524ACharged particle energy analyzersKRATOS ANALYTICAL LTD·Filed 1991·Granted Feb 9, 1993·16 cites·14 claims
- 1558US5160841AIon source for a mass spectrometerKRATOS ANALYTICAL LTD·Filed 1991·Granted Nov 3, 1992·13 cites·13 claims
- 1653US5286974ACharged particle energy analyzersKRATOS ANALYTICAL LTD·Filed 1992·Granted Feb 15, 1994·13 cites·25 claims
- 1753US2024213013A1Time of flight mass spectrometerKRATOS ANALYTICAL LTD·Filed 2022·Application pending·0 cites
- 1849US5120958AIon storage deviceKRATOS ANALYTICAL LTD·Filed 1991·Granted Jun 9, 1992·8 cites·17 claims
- 1948US8969796B2Timing device and methodKRATOS ANALYTICAL LTD·Filed 2014·Granted Mar 3, 2015·0 cites·13 claims
- 2046US2009129551A1Electrode for X-ray apparatusKRATOS ANALYTICAL LTD·Filed 2008·Application pending·0 cites
- 2144US12183564B2Mass spectrometry apparatusKRATOS ANALYTICAL LTD·Filed 2020·Granted Dec 31, 2024·0 cites·11 claims
- 2243US10340131B2Methods and apparatuses relating to cleaning and imaging an ion source using reflected lightKRATOS ANALYTICAL LTD·Filed 2015·Granted Jul 2, 2019·0 cites·13 claims
- 2339US10655157B2Microbial analysisKRATOS ANALYTICAL LTD·Filed 2014·Granted May 19, 2020·0 cites·20 claims
- 2428US5171987ACombined magnetic sector mass spectrometer and time-of-flight mass spectrometerKRATOS ANALYTICAL LTD·Filed 1991·Granted Dec 15, 1992·3 cites·18 claims
- 2527US10249482B2Time of flight mass spectrometerKRATOS ANALYTICAL LTD·Filed 2015·Granted Apr 2, 2019·0 cites·10 claims
- 2625US10948502B2Oxidized lipid detectionKRATOS ANALYTICAL LTD·Filed 2015·Granted Mar 16, 2021·0 cites·14 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →