Assignee
KOBAYASHI TOMOHIRO
JP·10 granted patents·4 pending applications·81 citations·filing 2006–2012
Top patents by PatentIndex Score
14 records- 0196US8795942B2Positive resist composition and patterning processKOBAYASHI TOMOHIRO·Filed 2007·Granted Aug 5, 2014·38 cites·20 claims
- 0294US8703384B2Positive resist composition and patterning processKOBAYASHI TOMOHIRO·Filed 2011·Granted Apr 22, 2014·11 cites·6 claims
- 0382US9270199B2Power conversion apparatus with a laminated bus bar comprising an exposed heat radiating portionKOBAYASHI TOMOHIRO·Filed 2011·Granted Feb 23, 2016·11 cites·7 claims
- 0482US8722321B2Patterning processKOBAYASHI TOMOHIRO·Filed 2012·Granted May 13, 2014·4 cites·15 claims
- 0582US8083015B2Hybrid vehicleKOBAYASHI TOMOHIRO·Filed 2006·Granted Dec 27, 2011·15 cites·4 claims
- 0662US9281760B2Power module and three-level power converter using the sameKOBAYASHI TOMOHIRO·Filed 2012·Granted Mar 8, 2016·2 cites·5 claims
- 0744US8858527B2Catheter having denatured part for contact with bodyKOBAYASHI TOMOHIRO·Filed 2006·Granted Oct 14, 2014·0 cites·8 claims
- 0842US8691494B2Patterning processKOBAYASHI TOMOHIRO·Filed 2012·Granted Apr 8, 2014·0 cites·13 claims
- 0940US8059481B2Semiconductor memory deviceKOBAYASHI TOMOHIRO·Filed 2009·Granted Nov 15, 2011·0 cites·16 claims
- 1040US2013065183A1Patterning process and resist compositionKOBAYASHI TOMOHIRO·Filed 2012·Application pending·0 cites
- 1140US2012135357A1Polymer, positive resist composition, and patterning processKOBAYASHI TOMOHIRO·Filed 2011·Application pending·0 cites
- 1240US2012214100A1Resist composition and patterning process using the sameKOBAYASHI TOMOHIRO·Filed 2012·Application pending·0 cites
- 1338US8120981B2Semiconductor integrated circuit device with fuse elements and control method thereforeKOBAYASHI TOMOHIRO·Filed 2009·Granted Feb 21, 2012·0 cites·11 claims
- 1438US2013319635A1Cooling device and power conversion deviceKOBAYASHI TOMOHIRO·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →