Assignee
KIKUCHI ARITOMO
JP·2 granted patents·11 citations·filing 2006–2011
Top patents by PatentIndex Score
2 records- 0183US8941729B2Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing methodKIKUCHI ARITOMO·Filed 2011·Granted Jan 27, 2015·7 cites·3 claims
- 0266US8294759B2Calibration method of electronic device test apparatusKIKUCHI ARITOMO·Filed 2006·Granted Oct 23, 2012·4 cites·18 claims
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