Assignee
KEMMERLING TODD RYLAND
US·2 granted patents·8 citations·filing 2008–2008
Top patents by PatentIndex Score
2 records- 0169US8095841B2Method and apparatus for testing semiconductor devices with autonomous expected value generationKEMMERLING TODD RYLAND·Filed 2008·Granted Jan 10, 2012·8 cites·30 claims
- 0231US8122309B2Method and apparatus for processing failures during semiconductor device testingKEMMERLING TODD RYLAND·Filed 2008·Granted Feb 21, 2012·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when KEMMERLING TODD RYLAND files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →