Individual holder
JOHNSON MORGAN T
US·9 granted patents·4 pending applications·47 citations·filing 2004–2012
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
13 records- 0190US7455915B2Selective application of conductive material to substrates by pick and place of compliant contact arraysJOHNSON MORGAN T·Filed 2006·Granted Nov 25, 2008·16 cites·14 claims
- 0284US8076216B2Methods and apparatus for thinning, testing and singulating a semiconductor waferJOHNSON MORGAN T·Filed 2009·Granted Dec 13, 2011·8 cites·18 claims
- 0382US9052355B2Wafer prober integrated with full-wafer contactorJOHNSON MORGAN T·Filed 2011·Granted Jun 9, 2015·3 cites·14 claims
- 0482US8461024B2Methods and apparatus for thinning, testing and singulating a semiconductor waferJOHNSON MORGAN T·Filed 2011·Granted Jun 11, 2013·4 cites·11 claims
- 0579US8476630B2Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonJOHNSON MORGAN T·Filed 2011·Granted Jul 2, 2013·3 cites·12 claims
- 0671US6994918B2Selective application of conductive material to circuit boards by pick and placeJOHNSON MORGAN T·Filed 2004·Granted Feb 7, 2006·12 cites·6 claims
- 0765US8088634B2Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonJOHNSON MORGAN T·Filed 2009·Granted Jan 3, 2012·1 cites·14 claims
- 0854USRE46075EFull-water test and burn-in mechanismJOHNSON MORGAN T·Filed 2012·Granted Jul 19, 2016·0 cites·24 claims
- 0952US8704544B2Method and apparatus for multi-planar edge-extended wafer translatorJOHNSON MORGAN T·Filed 2011·Granted Apr 22, 2014·0 cites·12 claims
- 1052US2009244526A1Fiber-Based Optical Alignment SystemJOHNSON MORGAN T·Filed 2008·Application pending·0 cites
- 1151US2012112778A1Methods and apparatus for multi-modal wafer testingJOHNSON MORGAN T·Filed 2011·Application pending·0 cites
- 1248US2010066395A1Wafer Prober Integrated With Full-Wafer ContacterJOHNSON MORGAN T·Filed 2009·Application pending·0 cites
- 1348US2010001749A1Method and Apparatus For Multi-Planar Edge-Extended Wafer TranslatorJOHNSON MORGAN T·Filed 2009·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →