Assignee
ITSUJI TAKEAKI
JP·13 granted patents·31 citations·filing 2007–2012
Top patents by PatentIndex Score
13 records- 0191US8129683B2Waveform information acquisition apparatus and waveform information acquisition methodITSUJI TAKEAKI·Filed 2008·Granted Mar 6, 2012·18 cites·14 claims
- 0280US8067739B2Photoconductive element for generation and detection of terahertz waveITSUJI TAKEAKI·Filed 2008·Granted Nov 29, 2011·5 cites·25 claims
- 0375US8618486B2Image forming apparatusITSUJI TAKEAKI·Filed 2012·Granted Dec 31, 2013·2 cites·7 claims
- 0473US8263937B2Apparatus and method for acquiring time waveform of terahertz wavesITSUJI TAKEAKI·Filed 2010·Granted Sep 11, 2012·3 cites·4 claims
- 0570US8144370B2Image forming apparatus, printing method and printing apparatusITSUJI TAKEAKI·Filed 2007·Granted Mar 27, 2012·2 cites·7 claims
- 0665US8405406B2Detecting apparatus and imaging apparatusITSUJI TAKEAKI·Filed 2008·Granted Mar 26, 2013·1 cites·10 claims
- 0756US8981301B2Apparatus and method of measuring terahertz waveITSUJI TAKEAKI·Filed 2011·Granted Mar 17, 2015·0 cites·12 claims
- 0853US8153999B2Terahertz wave generating device and apparatus using the sameITSUJI TAKEAKI·Filed 2009·Granted Apr 10, 2012·0 cites·10 claims
- 0947US8759769B2Terahertz-wave device, method of generating and detecting terahertz-waves with the device, and imaging apparatus equipped with the deviceITSUJI TAKEAKI·Filed 2011·Granted Jun 24, 2014·0 cites·20 claims
- 1046US9012833B2Terahertz wave measuring apparatus and measurement methodITSUJI TAKEAKI·Filed 2011·Granted Apr 21, 2015·0 cites·15 claims
- 1146US8232526B2Analyzing apparatusITSUJI TAKEAKI·Filed 2010·Granted Jul 31, 2012·0 cites·5 claims
- 1245US8513940B2Method of measuring terahertz wave and apparatus thereforITSUJI TAKEAKI·Filed 2011·Granted Aug 20, 2013·0 cites·13 claims
- 1343US8536530B2Terahertz wave transceiver and tomographic image acquisition apparatusITSUJI TAKEAKI·Filed 2011·Granted Sep 17, 2013·0 cites·7 claims
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