Assignee
IROC TECHNOLOGIES
FR·13 granted patents·2 pending applications·113 citations·filing 2000–2009
Top patents by PatentIndex Score
15 records- 0183US7904772B2Logic circuit protected against transient disturbancesIROC TECHNOLOGIES·Filed 2009·Granted Mar 8, 2011·10 cites·14 claims
- 0280US7124348B2Data storage method with error correctionIROC TECHNOLOGIES·Filed 2002·Granted Oct 17, 2006·31 cites·15 claims
- 0379US7274235B2Electronic circuitry protected against transient disturbances and method for simulating disturbancesIROC TECHNOLOGIES·Filed 2006·Granted Sep 25, 2007·14 cites·23 claims
- 0473US7093176B2Programmable test for memoriesIROC TECHNOLOGIES·Filed 2003·Granted Aug 15, 2006·25 cites·14 claims
- 0563US7073102B2Reconfiguration device for faulty memoryIROC TECHNOLOGIES·Filed 2002·Granted Jul 4, 2006·14 cites·5 claims
- 0655US6946985B2Device for reconfiguring a faulty storage assemblyIROC TECHNOLOGIES·Filed 2002·Granted Sep 20, 2005·5 cites·6 claims
- 0751US7565590B2Logic circuit protected against transitory perturbationsIROC TECHNOLOGIES·Filed 2007·Granted Jul 21, 2009·0 cites·5 claims
- 0851US7493549B2Electronic circuits assembly comprising at least one memory with error correcting meansIROC TECHNOLOGIES·Filed 2002·Granted Feb 17, 2009·5 cites·8 claims
- 0951US7380192B1Logic circuit protected against transient disturbancesIROC TECHNOLOGIES·Filed 2000·Granted May 27, 2008·4 cites·8 claims
- 1050US2008028278A1Circuit architecture protected against perturbationsIROC TECHNOLOGIES·Filed 2007·Application pending·0 cites
- 1144US7990759B2Hardened memory cellIROC TECHNOLOGIES·Filed 2006·Granted Aug 2, 2011·2 cites·28 claims
- 1244US7380165B2Assembly of electronic circuits comprising means for decontaminating error-contaminated partsIROC TECHNOLOGIES·Filed 2002·Granted May 27, 2008·1 cites·17 claims
- 1343US7126320B2Evaluation of the characteristics of electric pulsesIROC TECHNOLOGIES·Filed 2003·Granted Oct 24, 2006·2 cites·19 claims
- 1436US7778001B2Integrated circuit protected against short circuits and operating errors following the passage on an ionizing radiationIROC TECHNOLOGIES·Filed 2006·Granted Aug 17, 2010·0 cites·15 claims
- 1528US2008077376A1Apparatus and method for the determination of SEU and SET disruptions in a circuit caused by ionizing particle strikesIROC TECHNOLOGIES·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →