Assignee
INTEGRATED MEASUREMENT SYSTEMS
US·2 granted patents·170 citations·filing 1997–1998
Top patents by PatentIndex Score
2 records- 0183US6205407B1System and method for generating test program code simultaneously with data produced by ATPG or simulation pattern capture programINTEGRATED MEASUREMENT SYSTEMS·Filed 1998·Granted Mar 20, 2001·99 cites·18 claims
- 0278US5845234ASystem and method for efficiently generating testing program code for use in automatic test equipmentINTEGRATED MEASUREMENT SYSTEMS·Filed 1997·Granted Dec 1, 1998·71 cites·21 claims
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