Assignee
INFIENON TECHNOLOGIES AG
DE·3 granted patents·9 citations·filing 2002–2003
Top patents by PatentIndex Score
3 records- 0158US6787801B2Wafer with additional circuit parts in the kerf area for testing integrated circuits on the waferINFIENON TECHNOLOGIES AG·Filed 2002·Granted Sep 7, 2004·7 cites·7 claims
- 0247US6768373B2Circuit configuration for demodulating a voltage which is ASK modulated by altering the amplitude between a low level and a high levelINFIENON TECHNOLOGIES AG·Filed 2003·Granted Jul 27, 2004·2 cites·7 claims
- 0342US6765970B2Method and apparatus for preventing interferenceINFIENON TECHNOLOGIES AG·Filed 2002·Granted Jul 20, 2004·0 cites·18 claims
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