Assignee
IKKU YUTAKA
0 granted patents·2 pending applications·0 citations·filing 2008–2009
Top patents by PatentIndex Score
2 records- 0152US2009134327A1Defect recognizing method, defect observing method, and charged particle beam apparatusIKKU YUTAKA·Filed 2008·Application pending·0 cites
- 0251US2009283677A1Section image acquiring method using combined charge particle beam apparatus and combined charge particle beam apparatusIKKU YUTAKA·Filed 2009·Application pending·0 cites
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