Assignee
IAS INC
JP·7 granted patents·3 pending applications·11 citations·filing 2014–2022
Top patents by PatentIndex Score
10 records- 0188US10151727B2Automatic localized substrate analysis device and analysis methodIAS INC·Filed 2015·Granted Dec 11, 2018·6 cites·2 claims
- 0277US11569081B2Method for analyzing metal fine particles, and inductively coupled plasma mass spectrometry methodIAS INC·Filed 2019·Granted Jan 31, 2023·2 cites·1 claims
- 0376US10024801B2Analysis system for online-transferred analysis sampleIAS INC·Filed 2016·Granted Jul 17, 2018·2 cites·10 claims
- 0471US12354862B2Method for analyzing metal microparticles, and inductively coupled plasma mass spectrometry methodIAS INC·Filed 2022·Granted Jul 8, 2025·0 cites·2 claims
- 0570US10688485B2Substrate analysis nozzle and method for analyzing substrateIAS INC·Filed 2017·Granted Jun 23, 2020·1 cites·2 claims
- 0654US11422071B2Substrate analysis method and substrate analyzerIAS INC·Filed 2019·Granted Aug 23, 2022·0 cites·3 claims
- 0748US2025391648A1Method for quantitative analysis of elementsIAS INC·Filed 2022·Application pending·0 cites
- 0841US9741627B2Substrate etching apparatus and substrate analysis methodIAS INC·Filed 2014·Granted Aug 22, 2017·0 cites·20 claims
- 0934US2019013248A1Nozzle for substrate analysisIAS INC·Filed 2016·Application pending·0 cites
- 1032US2018217036A1Silicon substrate analyzing deviceIAS INC·Filed 2016·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →