Assignee
HUNTLEY JONATHAN MARK
GB·1 granted patent·1 pending application·1 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0141US8908186B2Apparatus for the absolute measurement of two dimensional optical path distributions using interferometryHUNTLEY JONATHAN MARK·Filed 2010·Granted Dec 9, 2014·1 cites·19 claims
- 0227US2015233707A1Method and apparatus of measuring the shape of an objectHUNTLEY JONATHAN MARK·Filed 2011·Application pending·0 cites
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