Individual holder
HUNG YAU Y
US·3 granted patents·99 citations·filing 1987–1989
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
3 records- 0185US4887899AApparatus and method for electronic analysis of test objectsHUNG YAU Y·Filed 1987·Granted Dec 19, 1989·59 cites·19 claims
- 0262US5011280AMethod of measuring displacement between points on a test objectHUNG YAU Y·Filed 1989·Granted Apr 30, 1991·22 cites·7 claims
- 0358US5004345ADual-lens shearing interferometerHUNG YAU Y·Filed 1988·Granted Apr 2, 1991·18 cites·7 claims
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