Assignee
HIYOSHI TORU
JP·4 granted patents·4 pending applications·6 citations·filing 2011–2012
Top patents by PatentIndex Score
8 records- 0177US9012922B2Silicon carbide semiconductor device and method for manufacturing sameHIYOSHI TORU·Filed 2012·Granted Apr 21, 2015·4 cites·10 claims
- 0266US8765562B2Method for manufacturing silicon carbide semiconductor deviceHIYOSHI TORU·Filed 2012·Granted Jul 1, 2014·2 cites·15 claims
- 0342US8772139B2Method of manufacturing semiconductor deviceHIYOSHI TORU·Filed 2011·Granted Jul 8, 2014·0 cites·4 claims
- 0440US2013065384A1Method for manufacturing silicon carbide semiconductor deviceHIYOSHI TORU·Filed 2012·Application pending·0 cites
- 0539US9012335B2Silicon carbide semiconductor device and method for manufacturing the sameHIYOSHI TORU·Filed 2011·Granted Apr 21, 2015·0 cites·17 claims
- 0638US2012175638A1Semiconductor deviceHIYOSHI TORU·Filed 2012·Application pending·0 cites
- 0737US2011309376A1Method of cleaning silicon carbide semiconductor, silicon carbide semiconductor, and silicon carbide semiconductor deviceHIYOSHI TORU·Filed 2011·Application pending·0 cites
- 0836US2012018743A1Semiconductor deviceHIYOSHI TORU·Filed 2011·Application pending·0 cites
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