Assignee
HESS CARL
US·4 granted patents·10 citations·filing 2004–2012
Top patents by PatentIndex Score
4 records- 0167US8810646B2Focus offset contamination inspectionHESS CARL·Filed 2011·Granted Aug 19, 2014·1 cites·18 claims
- 0266US8151220B2Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout dataHESS CARL·Filed 2004·Granted Apr 3, 2012·9 cites·23 claims
- 0340US9208552B2Method and system for hybrid reticle inspectionHESS CARL·Filed 2012·Granted Dec 8, 2015·0 cites·27 claims
- 0440US8914754B2Database-driven cell-to-cell reticle inspectionHESS CARL·Filed 2012·Granted Dec 16, 2014·0 cites·13 claims
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