Assignee
HATAKEYAMA NORIHITO
JP·2 granted patents·1 pending application·1 citations·filing 2016–2017
Top patents by PatentIndex Score
3 records- 0146US10172584B2Method for generating approximate function of total MTF of X-ray image, based on conditions for imaging with X-rayHATAKEYAMA NORIHITO·Filed 2016·Granted Jan 8, 2019·1 cites·3 claims
- 0225US2017020476A1Method for generating approximate function of total mtf of x-ray image, based on conditions for imaging with x-rayHATAKEYAMA NORIHITO·Filed 2016·Application pending·0 cites
- 0322US10610188B2X-ray imaging condition modification method and x-ray systemHATAKEYAMA NORIHITO·Filed 2017·Granted Apr 7, 2020·0 cites·4 claims
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