Assignee
HARADA KEN
JP·4 granted patents·2 pending applications·17 citations·filing 2010–2012
Top patents by PatentIndex Score
6 records- 0187US8946628B2Electron beam interference device and electron beam interferometryHARADA KEN·Filed 2012·Granted Feb 3, 2015·9 cites·14 claims
- 0284US8193494B2Transmission electron microscope and method for observing specimen image with the sameHARADA KEN·Filed 2010·Granted Jun 5, 2012·7 cites·20 claims
- 0362US8653472B2Electromagnetic field application systemHARADA KEN·Filed 2010·Granted Feb 18, 2014·1 cites·16 claims
- 0446US9864114B2Zone plate having annular or spiral shape and Y-shaped branching edge dislocationHARADA KEN·Filed 2011·Granted Jan 9, 2018·0 cites·7 claims
- 0541US2014197312A1Electron microscope and sample observation methodHARADA KEN·Filed 2011·Application pending·0 cites
- 0638US2012241612A1Electron Beam Biprism Device and Electron Beam DeviceHARADA KEN·Filed 2010·Application pending·0 cites
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