Assignee
HANADA YOSHIYUKI
JP·1 granted patent·1 pending application·0 citations·filing 2007–2007
Top patents by PatentIndex Score
2 records- 0135US8131057B2Defect distribution pattern comparison method and systemHANADA YOSHIYUKI·Filed 2007·Granted Mar 6, 2012·0 cites·8 claims
- 0232US2009277586A1Gas Introducing Apparatus, Manufacturing Method for the Gas Introducing Apparatus and Processing ApparatusHANADA YOSHIYUKI·Filed 2007·Application pending·0 cites
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