Assignee
HAGMANN MARK J
12 granted patents·3 pending applications·29 citations·filing 2003–2022
Top patents by PatentIndex Score
15 records- 0186US9442078B2Scanning frequency comb microscopy (SFCM) for carrier profiling in semiconductorsHAGMANN MARK J·Filed 2015·Granted Sep 13, 2016·3 cites·14 claims
- 0283US10006933B2Method of carrier profiling utilizing dielectric relaxationHAGMANN MARK J·Filed 2016·Granted Jun 26, 2018·2 cites·4 claims
- 0382US9927461B2Apparatus and algorithm for carrier profiling in scanning frequency comb microscopyHAGMANN MARK J·Filed 2017·Granted Mar 27, 2018·2 cites·6 claims
- 0479US7613578B2Method for noninvasive determination of a distribution of electrical current and apparatus for the sameHAGMANN MARK J·Filed 2007·Granted Nov 3, 2009·9 cites·28 claims
- 0568US10401383B2Frequency comb feedback control for scanning probe microscopyHAGMANN MARK J·Filed 2018·Granted Sep 3, 2019·0 cites·7 claims
- 0667US8492966B2Symmetric field emission devices using distributed capacitive ballasting with multiple emitters to obtain large emitted currents at high frequenciesHAGMANN MARK J·Filed 2009·Granted Jul 23, 2013·1 cites·13 claims
- 0767US2021302466A1Frequency comb feedback control for scanning probe microscopyHAGMANN MARK J·Filed 2019·Application pending·0 cites
- 0864US9075081B2Method and means for coupling high-frequency energy to and/or from the nanoscale junction of an electrically-conductive tip with a semiconductorHAGMANN MARK J·Filed 2014·Granted Jul 7, 2015·1 cites·16 claims
- 0960US7141781B2Efficient high-frequency energy coupling in radiation-assisted field emissionHAGMANN MARK J·Filed 2003·Granted Nov 28, 2006·4 cites·46 claims
- 1050US2022303016A1Nanoscale circuit to use incident laser radiation to generate and radiate terahertz harmonicsHAGMANN MARK J·Filed 2022·Application pending·0 cites
- 1146US10401382B2Method of carrier profiling in semiconductorsHAGMANN MARK J·Filed 2018·Granted Sep 3, 2019·0 cites·4 claims
- 1240USD695801STest fixture for scanning probe microscopyHAGMANN MARK J·Filed 2012·Granted Dec 17, 2013·6 cites·1 claims
- 1339US2018172727A1Method and Apparatus for carrier profiling of semiconductors utilizing simultaneous techniques utilizing a simulator and a Field-Programmable Gate ArrayHAGMANN MARK J·Filed 2017·Application pending·0 cites
- 1437US9885736B2Electrode control methodology for a scanning tunneling microscopeHAGMANN MARK J·Filed 2016·Granted Feb 6, 2018·0 cites·10 claims
- 1532USD662430SCalibration fixture for current probesHAGMANN MARK J·Filed 2010·Granted Jun 26, 2012·1 cites·1 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →