Assignee
GRISE GARY D
US·3 granted patents·2 pending applications·10 citations·filing 2006–2012
Technology mixG01R5
Top patents by PatentIndex Score
5 records- 0186US8423847B2Microcontroller for logic built-in self test (LBIST)GRISE GARY D·Filed 2012·Granted Apr 16, 2013·5 cites·17 claims
- 0266US8538718B2Clock edge grouping for at-speed testGRISE GARY D·Filed 2010·Granted Sep 17, 2013·2 cites·20 claims
- 0365US8205124B2Microcontroller for logic built-in self test (LBIST)GRISE GARY D·Filed 2008·Granted Jun 19, 2012·3 cites·26 claims
- 0437US2008005634A1Scan chain circuitry that enables scan testing at functional clock speedGRISE GARY D·Filed 2006·Application pending·0 cites
- 0537US2008222472A1Method for automatic test pattern generation for one test constraint at a timeGRISE GARY D·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →