Assignee
GRACE SEMICONDUCTOR MFG CORP
CN·28 granted patents·3 pending applications·92 citations·filing 2004–2013
Top patents by PatentIndex Score
31 records- 0176US7307016B1Method of processing metal surface in dual damascene manufacturingGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted Dec 11, 2007·5 cites·9 claims
- 0274US8778761B2Method of manufacturing semiconductor deviceGRACE SEMICONDUCTOR MFG CORP·Filed 2013·Granted Jul 15, 2014·5 cites·14 claims
- 0373US7022565B1Method of fabricating a trench capacitor of a mixed mode integrated circuitGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Apr 4, 2006·22 cites·9 claims
- 0471US7338853B2High power radio frequency integrated circuit capable of impeding parasitic current lossGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted Mar 4, 2008·5 cites·8 claims
- 0567US7280423B1Current-mode sensing structure of high-density multiple-port register in embedded flash memory procedure and method for the sameGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted Oct 9, 2007·7 cites·13 claims
- 0665US9082486B2Row decoding circuit and memoryGRACE SEMICONDUCTOR MFG CORP·Filed 2013·Granted Jul 14, 2015·3 cites·20 claims
- 0763US7022583B1Method of forming a shallow trench isolation device to prevent kick effectGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Apr 4, 2006·16 cites·9 claims
- 0861US7371664B2Process for wafer thinningGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted May 13, 2008·1 cites·3 claims
- 0957US7324382B2Current-mode sensing structure used in high-density multiple-port register in logic processing and method for the sameGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted Jan 29, 2008·4 cites·13 claims
- 1054US7015149B2Simplified dual damascene processGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Mar 21, 2006·6 cites·12 claims
- 1153US7192823B2Manufacturing method for transistor of electrostatic discharge protection deviceGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Mar 20, 2007·5 cites·15 claims
- 1252US7816018B2Organic electroluminescent materials and organic electroluminescent device using the sameGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted Oct 19, 2010·0 cites·18 claims
- 1352US7022567B2Method of fabricating self-aligned contact structuresGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Apr 4, 2006·5 cites·10 claims
- 1445US7452639B2Photomask with photoresist test patterns and pattern inspection methodGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Nov 18, 2008·2 cites·14 claims
- 1544US7282417B1Ion doping method to form source and drainGRACE SEMICONDUCTOR MFG CORP·Filed 2006·Granted Oct 16, 2007·0 cites·7 claims
- 1643US7221035B2Semiconductor structure avoiding poly stringer formationGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted May 22, 2007·2 cites·10 claims
- 1743US6968251B2Defect analysis sampling controlGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Nov 22, 2005·3 cites·17 claims
- 1843US2011037119A1MemoryGRACE SEMICONDUCTOR MFG CORP·Filed 2009·Application pending·0 cites
- 1943US2011038214A1Gate-separated type flash memory with shared word lineGRACE SEMICONDUCTOR MFG CORP·Filed 2009·Application pending·0 cites
- 2042US9153322B2Memory array device and method for reducing read current of the sameGRACE SEMICONDUCTOR MFG CORP·Filed 2013·Granted Oct 6, 2015·0 cites·9 claims
- 2140US9019740B2Memory and method of operating the sameGRACE SEMICONDUCTOR MFG CORP·Filed 2012·Granted Apr 28, 2015·0 cites·17 claims
- 2240US7141469B2Method of forming poly insulator poly capacitors by using a self-aligned salicide processGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Nov 28, 2006·1 cites·8 claims
- 2340US2014167284A1Interconnect structure and forming method thereofGRACE SEMICONDUCTOR MFG CORP·Filed 2013·Application pending·0 cites
- 2436US9177649B2Flash memory circuitGRACE SEMICONDUCTOR MFG CORP·Filed 2013·Granted Nov 3, 2015·0 cites·11 claims
- 2536US7186603B2Method of forming notched gate structureGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Mar 6, 2007·0 cites·14 claims
- 2636US6998868B2Test key for bridge and continuity testingGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Feb 14, 2006·0 cites·15 claims
- 2734US7332741B2Multidirectional leakage path test structureGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Feb 19, 2008·0 cites·17 claims
- 2829US8698237B2Superjunction LDMOS and manufacturing method of the sameGRACE SEMICONDUCTOR MFG CORP·Filed 2012·Granted Apr 15, 2014·0 cites·6 claims
- 2929US7084036B2Data writing method for mask read only memoryGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Aug 1, 2006·0 cites·7 claims
- 3026US7387948B2Structure and method of forming a semiconductor material waferGRACE SEMICONDUCTOR MFG CORP·Filed 2005·Granted Jun 17, 2008·0 cites·20 claims
- 3123US9071254B2Oscillator and self-calibration method thereofGRACE SEMICONDUCTOR MFG CORP·Filed 2013·Granted Jun 30, 2015·0 cites·11 claims
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