Assignee
GASTALDO PHILIPPE
FR·3 granted patents·1 pending application·10 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0178US8654324B2Device and method for inspecting semiconductor wafersGASTALDO PHILIPPE·Filed 2010·Granted Feb 18, 2014·5 cites·15 claims
- 0267US8817249B2Device and method for inspecting moving semiconductor wafersGASTALDO PHILIPPE·Filed 2011·Granted Aug 26, 2014·3 cites·14 claims
- 0358US9007456B2Device and method for inspecting semiconductor wafersGASTALDO PHILIPPE·Filed 2009·Granted Apr 14, 2015·2 cites·17 claims
- 0447US2009195786A1Device for inspecting semi-conductor wafersGASTALDO PHILIPPE·Filed 2008·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →