Assignee
FUJITSU NAGANO SYSTEMS ENGINEE
JP·5 granted patents·59 citations·filing 2001–2002
Top patents by PatentIndex Score
5 records- 0179US7483818B2Structural analysis program, a structural analysis method, a structural analysis apparatus, and a production process of a semiconductor integrated circuitFUJITSU NAGANO SYSTEMS ENGINEE·Filed 2002·Granted Jan 27, 2009·39 cites·14 claims
- 0255US6606090B2Three-dimensional model analyzing apparatusFUJITSU NAGANO SYSTEMS ENGINEE·Filed 2001·Granted Aug 12, 2003·7 cites·7 claims
- 0352US6671656B2Structure analysis method and program, and recording medium thereofFUJITSU NAGANO SYSTEMS ENGINEE·Filed 2002·Granted Dec 30, 2003·4 cites·9 claims
- 0449US6965688B2Three-dimensional model analyzing apparatus detecting and smoothing edges before analytic operationFUJITSU NAGANO SYSTEMS ENGINEE·Filed 2001·Granted Nov 15, 2005·6 cites·4 claims
- 0549US6897864B2Method and program for coordinate decision procedure of voxel model, and recording medium thereofFUJITSU NAGANO SYSTEMS ENGINEE·Filed 2002·Granted May 24, 2005·3 cites·5 claims
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