Assignee
FU KUO-KUEI
TW·4 granted patents·3 pending applications·2 citations·filing 2004–2012
Top patents by PatentIndex Score
7 records- 0170US8831333B2Mask pattern analysis apparatus and method for analyzing mask patternFU KUO KUEI·Filed 2012·Granted Sep 9, 2014·2 cites·18 claims
- 0248US8497568B2Monitoring pattern, and pattern stitch monitoring method and wafer therewithFU KUO KUEI·Filed 2011·Granted Jul 30, 2013·0 cites·13 claims
- 0347US8192902B2Replaced photomaskFU KUO-KUEI·Filed 2011·Granted Jun 5, 2012·0 cites·6 claims
- 0445US8533638B2Post-optical proximity correction photoresist pattern collapse ruleFU KUO KUEI·Filed 2011·Granted Sep 10, 2013·0 cites·5 claims
- 0536US2012259445A1Method for matching assistant feature toolsFU KUO KUEI·Filed 2011·Application pending·0 cites
- 0636US2007212655A1Method for applying T-shaped photo-resist pattern to fabricate a wiring pattern with small structural dimensionsFU KUO-KUEI·Filed 2006·Application pending·0 cites
- 0729US2006103034A1Overlay mark for a non-critical layer of critical dimensionsFU KUO-KUEI·Filed 2004·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →