Assignee
FOUR DIMENSIONS INC
US·4 granted patents·1 pending application·35 citations·filing 1999–2025
Top patents by PatentIndex Score
5 records- 0181US7253649B1Automatic mercury probe for use with a semiconductor waferFOUR DIMENSIONS INC·Filed 2006·Granted Aug 7, 2007·12 cites·24 claims
- 0269US7714596B2System and methods of measuring semiconductor sheet resistivity and junction leakage currentFOUR DIMENSIONS INC·Filed 2007·Granted May 11, 2010·9 cites·17 claims
- 0368US2026057509A1Automatic probe head monitor for mercury probe measurementsFOUR DIMENSIONS INC·Filed 2025·Application pending·0 cites
- 0445US6435045B1Apparatus and method for automatically changing the probe head in a four-point probe systemFOUR DIMENSIONS INC·Filed 1999·Granted Aug 20, 2002·14 cites·13 claims
- 0531US6810758B2Apparatus and method for automatically changing the probe head in a four-point probe systemFOUR DIMENSIONS INC·Filed 2002·Granted Nov 2, 2004·0 cites·16 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →