Assignee
FIEKOWSKY PETER J
US·4 granted patents·120 citations·filing 1999–2005
Top patents by PatentIndex Score
4 records- 0192US6397165B1Microscopic corner radius measurement systemFIEKOWSKY PETER J·Filed 2001·Granted May 28, 2002·41 cites·10 claims
- 0291US6405153B1Microscopic feature opacity measurement systemFIEKOWSKY PETER J·Filed 2000·Granted Jun 11, 2002·36 cites·6 claims
- 0388US7472372B1Fast image simulation for photolithographyFIEKOWSKY PETER J·Filed 2005·Granted Dec 30, 2008·10 cites·15 claims
- 0475US6167355AHigh accuracy particle dimension measurement systemFIEKOWSKY PETER J·Filed 1999·Granted Dec 26, 2000·33 cites·51 claims
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