Assignee
FANG WEI
US·10 granted patents·4 pending applications·168 citations·filing 2001–2021
Top patents by PatentIndex Score
14 records- 0194USD983988SSex toyFANG WEI·Filed 2021·Granted Apr 18, 2023·30 cites·1 claims
- 0292US6554450B2Artificial lighting apparatus for young plants using light emitting diodes as light sourceFANG WEI·Filed 2001·Granted Apr 29, 2003·72 cites·21 claims
- 0388US6474838B2Artificial lighting apparatus for young plants using light emitting diodes as light sourceFANG WEI·Filed 2001·Granted Nov 5, 2002·44 cites·7 claims
- 0485US8884224B2Charged particle beam imaging assembly and imaging method thereofFANG WEI·Filed 2009·Granted Nov 11, 2014·9 cites·20 claims
- 0577US9494856B1Method and system for fast inspecting defectsFANG WEI·Filed 2011·Granted Nov 15, 2016·2 cites·17 claims
- 0676US8606017B1Method for inspecting localized image and system thereofFANG WEI·Filed 2011·Granted Dec 10, 2013·7 cites·26 claims
- 0776US8432441B2Method and system for measuring critical dimension and monitoring fabrication uniformityFANG WEI·Filed 2011·Granted Apr 30, 2013·3 cites·4 claims
- 0857US9999760B2DVDMS sensitizer for cancer sonodynamic therapyFANG WEI·Filed 2015·Granted Jun 19, 2018·1 cites·9 claims
- 0953US2010192605A1Humidity control system using desiccant deviceFANG WEI·Filed 2008·Application pending·0 cites
- 1048US8805054B2Method and system of classifying defects on a waferFANG WEI·Filed 2011·Granted Aug 12, 2014·0 cites·12 claims
- 1146US8923601B2Method for inspecting overlay shift defect during semiconductor manufacturing and apparatus thereofFANG WEI·Filed 2011·Granted Dec 30, 2014·0 cites·25 claims
- 1244US2010158346A1Method and system of classifying defects on a waferFANG WEI·Filed 2008·Application pending·0 cites
- 1342US2008127657A1Power generation system driven by heat pumpFANG WEI·Filed 2007·Application pending·0 cites
- 1440US2018082564A1Wireless attendance monitoring apparatusFANG WEI·Filed 2017·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →