Assignee
ESSAI INC
US·18 granted patents·11 pending applications·120 citations·filing 2006–2025
Top patents by PatentIndex Score
29 records- 0198US10908207B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2016·Granted Feb 2, 2021·31 cites·4 claims
- 0298US10126356B2Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plateESSAI INC·Filed 2016·Granted Nov 13, 2018·30 cites·17 claims
- 0396US11378588B2Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2020·Granted Jul 5, 2022·3 cites·10 claims
- 0492US7663388B2Active thermal control unit for maintaining the set point temperature of a DUTESSAI INC·Filed 2008·Granted Feb 16, 2010·26 cites·16 claims
- 0589US10481175B2Contactor with angled depressible probesESSAI INC·Filed 2017·Granted Nov 19, 2019·3 cites·22 claims
- 0687US9804223B2Systems and methods for conforming test tooling to integrated circuit device with heater socketESSAI INC·Filed 2015·Granted Oct 31, 2017·4 cites·19 claims
- 0781US11293976B1Integrated circuit device test tooling with dual angle cavitiesESSAI INC·Filed 2020·Granted Apr 5, 2022·1 cites·7 claims
- 0880US7651340B2Chip actuator cover assemblyESSAI INC·Filed 2008·Granted Jan 26, 2010·10 cites·29 claims
- 0979US9007080B2Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature controlESSAI INC·Filed 2013·Granted Apr 14, 2015·4 cites·11 claims
- 1076US2024345132A1Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 1173US9383406B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2014·Granted Jul 5, 2016·2 cites·3 claims
- 1272US2022413010A1Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2022·Application pending·0 cites
- 1368US12085587B2Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2021·Granted Sep 10, 2024·0 cites·7 claims
- 1468US9494642B2Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanismsESSAI INC·Filed 2013·Granted Nov 15, 2016·2 cites·8 claims
- 1567US2020225264A1Contactor with angled depressible probesESSAI INC·Filed 2019·Application pending·0 cites
- 1663US7583097B2Contactor nest for an IC device and methodESSAI INC·Filed 2006·Granted Sep 1, 2009·4 cites·21 claims
- 1763US2026016533A1Test interconnect with integrated loopbacksESSAI INC·Filed 2025·Application pending·0 cites
- 1860US2025237697A1Systems and methods for tool-less, quick change elastomeric contact interfaces for integrated circuit testingESSAI INC·Filed 2024·Application pending·0 cites
- 1959US2026002985A1Test interconnect temperature control with gas flowESSAI INC·Filed 2024·Application pending·0 cites
- 2058US2025321267A1Versatile interposer with diagonal vias for testing of integrated circuit devicesESSAI INC·Filed 2024·Application pending·0 cites
- 2158US2025085309A1Low cross-talk interconnection device with impedance-tuned hybrid shielding structures for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 2252US9557373B2Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structureESSAI INC·Filed 2014·Granted Jan 31, 2017·0 cites·12 claims
- 2350US2026016501A1Test interconnect with conductive planes and components for power integrity and thermal managementESSAI INC·Filed 2024·Application pending·0 cites
- 2448US11906550B2Probe system for QFP integrated circuit device test toolingESSAI INC·Filed 2021·Granted Feb 20, 2024·0 cites·6 claims
- 2546US9229049B2Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestalsESSAI INC·Filed 2013·Granted Jan 5, 2016·0 cites·12 claims
- 2645US2015022226A1Systems and methods for conforming test tooling to integrated circuit device profiles with coaxial socketESSAI INC·Filed 2014·Application pending·0 cites
- 2743US10094853B2Systems and methods for reliable integrated circuit device test toolingESSAI INC·Filed 2015·Granted Oct 9, 2018·0 cites·14 claims
- 2843US9279852B2Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushingsESSAI INC·Filed 2013·Granted Mar 8, 2016·0 cites·2 claims
- 2941US2020379010A1Systems and methods for high speed test probing of densely packaged semiconductor devicesESSAI INC·Filed 2020·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →