Assignee
DIGITAL INSTR INC
US·36 granted patents·2,755 citations·filing 1988–1998
Top patents by PatentIndex Score
36 records- 0197US5412980ATapping atomic force microscopeDIGITAL INSTR INC·Filed 1992·Granted May 9, 1995·215 cites·28 claims
- 0297US5266801AJumping probe microscopeDIGITAL INSTR INC·Filed 1993·Granted Nov 30, 1993·191 cites·19 claims
- 0396US5025658ACompact atomic force microscopeDIGITAL INSTR INC·Filed 1989·Granted Jun 25, 1991·102 cites·32 claims
- 0495US5418363AScanning probe microscope using stored data for vertical probe positioningDIGITAL INSTR INC·Filed 1994·Granted May 23, 1995·119 cites·37 claims
- 0595US5308974AScanning probe microscope using stored data for vertical probe positioningDIGITAL INSTR INC·Filed 1992·Granted May 3, 1994·116 cites·46 claims
- 0694US5463897AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1993·Granted Nov 7, 1995·115 cites·41 claims
- 0793US5519212ATapping atomic force microscope with phase or frequency detectionDIGITAL INSTR INC·Filed 1995·Granted May 21, 1996·182 cites·30 claims
- 0892US5705814AScanning probe microscope having automatic probe exchange and alignmentDIGITAL INSTR INC·Filed 1995·Granted Jan 6, 1998·183 cites·75 claims
- 0991US5557156AScan control for scanning probe microscopesDIGITAL INSTR INC·Filed 1994·Granted Sep 17, 1996·76 cites·45 claims
- 1091US5229606AJumping probe microscopeDIGITAL INSTR INC·Filed 1989·Granted Jul 20, 1993·72 cites·30 claims
- 1190US5224376AAtomic force microscopeDIGITAL INSTR INC·Filed 1992·Granted Jul 6, 1993·64 cites·11 claims
- 1288US5415027AJumping probe microscopeDIGITAL INSTR INC·Filed 1993·Granted May 16, 1995·62 cites·20 claims
- 1388US5103095AScanning probe microscope employing adjustable tilt and unitary headDIGITAL INSTR INC·Filed 1990·Granted Apr 7, 1992·96 cites·19 claims
- 1488US4954704AMethod to increase the speed of a scanning probe microscopeDIGITAL INSTR INC·Filed 1989·Granted Sep 4, 1990·76 cites·28 claims
- 1586US5400647AMethods of operating atomic force microscopes to measure frictionDIGITAL INSTR INC·Filed 1992·Granted Mar 28, 1995·60 cites·1 claims
- 1686US5329808AAtomic force microscopeDIGITAL INSTR INC·Filed 1993·Granted Jul 19, 1994·47 cites·4 claims
- 1786US5081390AMethod of operating a scanning probe microscope to improve drift characteristicsDIGITAL INSTR INC·Filed 1990·Granted Jan 14, 1992·66 cites·13 claims
- 1886US4871938APositioning device for a scanning tunneling microscopeDIGITAL INSTR INC·Filed 1988·Granted Oct 3, 1989·52 cites·35 claims
- 1985US5560244AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1995·Granted Oct 1, 1996·70 cites·7 claims
- 2085US5204531AMethod of adjusting the size of the area scanned by a scanning probeDIGITAL INSTR INC·Filed 1992·Granted Apr 20, 1993·61 cites·27 claims
- 2185US4889988AFeedback control for scanning tunnel microscopesDIGITAL INSTR INC·Filed 1988·Granted Dec 26, 1989·49 cites·43 claims
- 2284US5077473ADrift compensation for scanning probe microscopes using an enhanced probe positioning systemDIGITAL INSTR INC·Filed 1990·Granted Dec 31, 1991·76 cites·17 claims
- 2383US5051646AMethod of driving a piezoelectric scanner linearly with timeDIGITAL INSTR INC·Filed 1990·Granted Sep 24, 1991·55 cites·26 claims
- 2481US5189906ACompact atomic force microscopeDIGITAL INSTR INC·Filed 1991·Granted Mar 2, 1993·44 cites·4 claims
- 2579US5898106AMethod and apparatus for obtaining improved vertical metrology measurementsDIGITAL INSTR INC·Filed 1997·Granted Apr 27, 1999·61 cites·68 claims
- 2679US5306919APositioning device for scanning probe microscopesDIGITAL INSTR INC·Filed 1992·Granted Apr 26, 1994·48 cites·28 claims
- 2779US5202004AScanning electrochemical microscopyDIGITAL INSTR INC·Filed 1989·Granted Apr 13, 1993·51 cites·45 claims
- 2879US5066858AScanning tunneling microscopes with correction for coupling effectsDIGITAL INSTR INC·Filed 1990·Granted Nov 19, 1991·46 cites·28 claims
- 2978US5198715AScanner for scanning probe microscopes having reduced Z-axis non-linearityDIGITAL INSTR INC·Filed 1991·Granted Mar 30, 1993·45 cites·8 claims
- 3078US4999494ASystem for scanning large sample areas with a scanning probe microscopeDIGITAL INSTR INC·Filed 1989·Granted Mar 12, 1991·33 cites·22 claims
- 3177US5714682AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1996·Granted Feb 3, 1998·42 cites·15 claims
- 3276US6032518AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1998·Granted Mar 7, 2000·59 cites·20 claims
- 3375US5253516AAtomic force microscope for small samples having dual-mode operating capabilityDIGITAL INSTR INC·Filed 1992·Granted Oct 19, 1993·39 cites·7 claims
- 3472US5553487AMethods of operating atomic force microscopes to measure frictionDIGITAL INSTR INC·Filed 1995·Granted Sep 10, 1996·37 cites·5 claims
- 3572US5237859AAtomic force microscopeDIGITAL INSTR INC·Filed 1991·Granted Aug 24, 1993·38 cites·28 claims
- 3637USRE37203EFeedback control for scanning tunnel microscopesDIGITAL INSTR INC·Filed 1998·Granted Jun 5, 2001·7 cites·0 claims
Join the waitlist — get patent alerts
Get an alert when DIGITAL INSTR INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →