Assignee
DENG XIAOWEI
US·17 granted patents·103 citations·filing 2008–2012
Top patents by PatentIndex Score
17 records- 0194US8654575B2Disturb-free static random access memory cellDENG XIAOWEI·Filed 2011·Granted Feb 18, 2014·18 cites·9 claims
- 0290US8498143B2Solid-state memory cell with improved read stabilityDENG XIAOWEI·Filed 2011·Granted Jul 30, 2013·13 cites·22 claims
- 0389US8760927B2Efficient static random-access memory layoutDENG XIAOWEI·Filed 2012·Granted Jun 24, 2014·11 cites·25 claims
- 0489US8462542B2Bit-by-bit write assist for solid-state memoryDENG XIAOWEI·Filed 2010·Granted Jun 11, 2013·13 cites·27 claims
- 0587US8228749B2Margin testing of static random access memory cellsDENG XIAOWEI·Filed 2010·Granted Jul 24, 2012·12 cites·22 claims
- 0684US8305798B2Memory cell with equalization write assist in solid-state memoryDENG XIAOWEI·Filed 2010·Granted Nov 6, 2012·9 cites·26 claims
- 0774US9455021B2Array power supply-based screening of static random access memory cells for bias temperature instabilityDENG XIAOWEI·Filed 2012·Granted Sep 27, 2016·3 cites·12 claims
- 0871US8670265B2Reducing power in SRAM using supply voltage controlDENG XIAOWEI·Filed 2012·Granted Mar 11, 2014·4 cites·27 claims
- 0968US8654562B2Static random access memory cell with single-sided buffer and asymmetric constructionDENG XIAOWEI·Filed 2012·Granted Feb 18, 2014·3 cites·5 claims
- 1067US8437213B2Characterization of bits in a functional memoryDENG XIAOWEI·Filed 2008·Granted May 7, 2013·6 cites·36 claims
- 1166US8432760B2Method of screening static random access memories for unstable memory cellsDENG XIAOWEI·Filed 2011·Granted Apr 30, 2013·3 cites·27 claims
- 1264US8472228B2Array-based integrated circuit with reduced proximity effectsDENG XIAOWEI·Filed 2010·Granted Jun 25, 2013·1 cites·19 claims
- 1364US8233341B2Method and structure for SRAM cell trip voltage measurementDENG XIAOWEI·Filed 2009·Granted Jul 31, 2012·5 cites·27 claims
- 1455US8139431B2Structure and methods for measuring margins in an SRAM bitDENG XIAOWEI·Filed 2009·Granted Mar 20, 2012·2 cites·14 claims
- 1544US9472268B2SRAM with buffered-read bit cells and its testingDENG XIAOWEI·Filed 2011·Granted Oct 18, 2016·0 cites·5 claims
- 1641US8174914B2Method and structure for SRAM Vmin/Vmax measurementDENG XIAOWEI·Filed 2009·Granted May 8, 2012·0 cites·26 claims
- 1735US9208899B2Universal test structures based SRAM on-chip parametric test module and methods of operating and testingDENG XIAOWEI·Filed 2010·Granted Dec 8, 2015·0 cites·8 claims
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