Assignee
DELMIC IP B V
NL·6 granted patents·2 pending applications·1 citations·filing 2015–2022
Top patents by PatentIndex Score
8 records- 0172US11742173B2Integrated optical and charged particle inspection apparatusDELMIC IP B V·Filed 2020·Granted Aug 29, 2023·1 cites·20 claims
- 0246USRE50540EMethod for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscopeDELMIC IP B V·Filed 2015·Granted Aug 19, 2025·0 cites·37 claims
- 0346US12306121B2Method and apparatus for inspecting a sample by means of multiple charged particle beamletsDELMIC IP B V·Filed 2021·Granted May 20, 2025·0 cites·11 claims
- 0443US12417894B2Method and manipulation device for handling samplesDELMIC IP B V·Filed 2020·Granted Sep 16, 2025·0 cites·17 claims
- 0543US2023298855A1Method and apparatus for micromachining a sample using a focused ion beamDELMIC IP B V·Filed 2021·Application pending·0 cites
- 0636US12123841B2Apparatus and method for projecting an array of multiple charged particle beamlets on a sampleDELMIC IP B V·Filed 2021·Granted Oct 22, 2024·0 cites·11 claims
- 0736US2024280357A1Method and apparatus for micromachining a sample using a focused ion beamDELMIC IP B V·Filed 2022·Application pending·0 cites
- 0830US12387905B2Apparatus and method for detecting one or more scanning charged particle beamsDELMIC IP B V·Filed 2020·Granted Aug 12, 2025·0 cites·17 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →